BS EN 60749-18-2003 半导体器件.机械和气候试验方法.电离辐射(总剂量)
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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Ionizingradiation(totaldose)
【原文标准名称】:半导体器件.机械和气候试验方法.电离辐射(总剂量)
【标准号】:BSEN60749-18-2003
【标准状态】:现行
【国别】:英国
【发布日期】:2003-03-13
【实施或试行日期】:2003-03-13
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体;定义;电子工程;电离辐射;电子设备及元件;集成电路;半导体器件;辐射效果;试验;气候;环境试验;气候试验;电气工程;元部件;机械试验;电学测量;破坏试验
【英文主题词】:Climate;Climatictests;Components;Definition;Definitions;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Ionizingradiation;Mechanicaltesting;Militaryequipment;Multilingual;Radiationeffects;Semiconductordevices;Semiconductors;Spacetransport;Testing
【摘要】:ThispartofIEC60749providesatestprocedurefordefiningrequirementsfortestingpackagedsemiconductorintegratedcircuitsanddiscretesemiconductordevicesforionizingradiation(totaldose)effectsfromacobalt-60(Co)gammaraysource.Thisstandardprovidesanacceleratedannealingtestforestimatinglowdoserateionizingradiationeffectsondevices.Thisannealingtestisimportantforlowdoserateorcertainotherapplicationsinwhichdevicesmayexhibitsignificanttime-dependenteffects.Thisstandardaddressesonlysteady-stateirradiations,andisnotapplicabletopulsetypeirradiations.Itisintendedformilitary-andspace-relatedapplications.Thisstandardmayproduceseveredegradationoftheelectricalpropertiesofirradiateddevicesandthusshouldbeconsideredadestructivetest.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:18P.;A4
【正文语种】:英语
【原文标准名称】:半导体器件.机械和气候试验方法.电离辐射(总剂量)
【标准号】:BSEN60749-18-2003
【标准状态】:现行
【国别】:英国
【发布日期】:2003-03-13
【实施或试行日期】:2003-03-13
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体;定义;电子工程;电离辐射;电子设备及元件;集成电路;半导体器件;辐射效果;试验;气候;环境试验;气候试验;电气工程;元部件;机械试验;电学测量;破坏试验
【英文主题词】:Climate;Climatictests;Components;Definition;Definitions;Destructivetesting;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Ionizingradiation;Mechanicaltesting;Militaryequipment;Multilingual;Radiationeffects;Semiconductordevices;Semiconductors;Spacetransport;Testing
【摘要】:ThispartofIEC60749providesatestprocedurefordefiningrequirementsfortestingpackagedsemiconductorintegratedcircuitsanddiscretesemiconductordevicesforionizingradiation(totaldose)effectsfromacobalt-60(Co)gammaraysource.Thisstandardprovidesanacceleratedannealingtestforestimatinglowdoserateionizingradiationeffectsondevices.Thisannealingtestisimportantforlowdoserateorcertainotherapplicationsinwhichdevicesmayexhibitsignificanttime-dependenteffects.Thisstandardaddressesonlysteady-stateirradiations,andisnotapplicabletopulsetypeirradiations.Itisintendedformilitary-andspace-relatedapplications.Thisstandardmayproduceseveredegradationoftheelectricalpropertiesofirradiateddevicesandthusshouldbeconsideredadestructivetest.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:18P.;A4
【正文语种】:英语
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